GRAPHICAL SEPARATION OF CRYSTALLITE SIZE FROM STRAIN BROADENING IN X-RAY DIFFRACTION PATTERNS
Technical Report
·
OSTI ID:4217544
A method for separating the crystallite contribution to the x-ray diffraction line broadening from the strain contribution is described. The half width of several reflections beta (hkl) which were corrected for instrumental broadening by any approximate method may be used. Since there is no demand for accurate data, the approximate method should be useful in dealing with irradiated specimens where the high background makes accurate intensity measurements difficult. Mathematical aspects are discussed and examples of application are given (J.R.D.)
- Research Organization:
- Westinghouse Electric Corp. Bettis Plant, Pittsburgh
- DOE Contract Number:
- AT(11-1)-GEN-14
- NSA Number:
- NSA-14-002808
- OSTI ID:
- 4217544
- Report Number(s):
- WAPD-T-918
- Country of Publication:
- United States
- Language:
- English
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