PHOTOMULTIPLIER FATIGUE
Technical Report
·
OSTI ID:4200294
The study of fatigue effects in photomultipliers was continued to include a study of the internal mechanism of fatigue in photomultipliers. Photomultiplier fatigue was found to be caused by surface changes on the dynodes of the electron multiplier due to electron bombardment. Two surface fractions that are major contributors to the process are cesium and oxygen. Some specially designed tubes were built and are being studied in an effort to determine the contribution each makes to the over-all fatigue. Design of test equipment and results are described. (auth)
- Research Organization:
- Du Pont de Nemours (E.I.) & Co. Savannah River Lab., Aiken, S.C.
- NSA Number:
- NSA-14-005320
- OSTI ID:
- 4200294
- Report Number(s):
- AECL-805(Paper 5.11)
- Country of Publication:
- Canada
- Language:
- English
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