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U.S. Department of Energy
Office of Scientific and Technical Information

High-voltage electron microscope studies of low-temperature radiation damage in silicon

Conference ·
OSTI ID:4195252
Research Organization:
Max-Planck-Institut fuer Metallforschung, Stuttgart
NSA Number:
NSA-32-014999
OSTI ID:
4195252
Country of Publication:
United Kingdom
Language:
English