Accurate Measurement of Noise Parameters in Ultra-Low Noise Opto-Feedback Spectrometer Systems

Journal Article · Wed Oct 01 00:00:00 EDT 1975 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/TNS.1975.4328063· OSTI ID:4192211

Llacer, Jorge

The accurate measurement of the basic noise parameters of ultra-low noise spectrometer systems has been developed in the frequency domain by spectrum analysis. This method overcomes some of the difficulties experienced in using conventional techniques. An analytic and experimental comparison between ''time'' and frequency domain techniques is carried out and the use of the latter as a method to develop extremely low-noise detector and FET packages is demonstrated. The origin of the remaining noise in high quality systems is traced to surface and gate junction generation through traps in the FET. (auth)

• Research Organization: Univ. of California, Berkeley, CA (United States)
• Sponsoring Organization: USDOE
• NSA Number: NSA-33-000764
• OSTI ID: 4192211
• Journal Information: IEEE Transactions on Nuclear Science, Vol. 22, Issue 5; Other Information: Orig. Receipt Date: 30-JUN-76; ISSN 0018-9499
• Publisher: Institute of Electrical and Electronics Engineers (IEEE)
• Country of Publication: United States
• Language: English

Related Subjects

N46130* -Instrumentation-Radiation Detection Instruments- Nuclear Spectroscopic Instrumentation
440103* -Instrumentation-Radiation Instrumentation- Nuclear Spectroscopic Instrumentation
*SEMICONDUCTOR DETECTORS- NOISE
*SPECTROMETERS- NOISE
FABRICATION
FEEDBACK
FIELD EFFECT TRANSISTORS
LEAKAGE CURRENT
MEASURING METHODS
OPTIMIZATION