Application of a low energy x-ray spectrometer to analyses of suspended air particulate matter

Conference · Fri Sep 12 00:00:00 EDT 1975

OSTI ID:4192178

Giauque, R D; Garrett, R B; Goda, L Y; Jaklevic, J M; Malone, D F

A semiconductor detector x-ray spectrometer has been constructed for the analysis of elements in air particulate specimens. The excitation radiation is provided, either directly or indirectly, using a low power (40 watts) Ag anode x- ray tube. Less than 100 ng for most of the elements in the range Mg $Yields$ Zr, Pb are easily detected within two 1-minute counting intervals. A calibration technique for light element analysis and an experimental method which compensates for particle size effects are discussed. (auth)

• Research Organization: California Univ., Berkeley (USA). Lawrence Berkeley Lab.
• DOE Contract Number: W-7405-ENG-48
• NSA Number: NSA-33-000778
• OSTI ID: 4192178
• Report Number(s): LBL-4402; CONF-750831-5
• Resource Relation: Conference: 24. annual conference on applications of x-ray analysis, Denver, Colorado, USA, 6 Aug 1975; Other Information: Orig. Receipt Date: 30-JUN-76
• Country of Publication: United States
• Language: English

Related Subjects

N46200* -Instrumentation-Radiometric Instruments
N40130 - -Chemistry-Analytical & Separations Chemistry-Radiometric & Radiochemical Procedures
440105* -Instrumentation-Radiation Instrumentation- Radiometric Instruments
*AEROSOLS- X-RAY FLUORESCENCE ANALYSIS
*PARTICLES- X-RAY FLUORESCENCE ANALYSIS
*X-RAY FLUORESCENCE ANALYZERS- DESIGN
AIR FILTERS
CALIBRATION
PARTICLE SIZE
SEMICONDUCTOR DETECTORS
X-RAY SOURCES
X-RAY SPECTROMETERS