A new confocal scanning laser MACROscope/Microscope applied to the characterization of solar cells
- Univ. of Waterloo, Ontario (Canada). Dept. of Physics
- Univ. of Rochester, NY (United States). Dept. of Electrical Engineering
Scanning stage microscopes have traditionally been used to provide high resolution, large area photocurrent mapping of solar cells and detectors. This imaging method, while very useful in the characterization and quality control of solar cells, is unfortunately slow (image acquisition takes several minutes). This paper describes a confocal scanning beam MACROscope-Microscope which can image specimens from 25 x 25 {micro}m up to 7.5 x 7.5 cm in size, a zoom factor of 3,000, using reflected light, photoluminescence, and optical beam induced current in less than 10s. Resolutions range from 0.25 to 10 {micro}m laterally and 0.5 to 300 {micro}m axially depending upon whether microscope of MACROscope mode is used. This instrument can therefore be used to characterize and provide quick and efficient quality control for solar cells and detectors at a microscopic and macroscopic level. A brief description of the MACROscope-Microscope is given. The MACROscope-Microscope`s many abilities are highlighted by showing various reflected-light, photoluminescence and optical beam induced current images from CdZnS/CuInSe{sub 2} thin film solar cells and porous silicon devices.
- OSTI ID:
- 417729
- Report Number(s):
- CONF-960401-; ISBN 1-55899-329-0; TRN: IM9705%%102
- Resource Relation:
- Conference: Spring meeting of the Materials Research Society (MRS), San Francisco, CA (United States), 8-12 Apr 1996; Other Information: PBD: 1996; Related Information: Is Part Of Thin films for photovoltaic and related device applications; Ginley, D. [ed.] [National Renewable Energy Lab., Golden, CO (United States)]; Catalano, A. [ed.] [Technology Assessment Group, Boulder, CO (United States)]; Schock, H.W. [ed.] [Univ. Stuttgart (Germany)]; Eberspacher, C. [ed.] [Unisun, Newbury Park, CA (United States)]; Peterson, T.M. [ed.] [Electric Power Research Inst., Palo Alto, CA (United States)]; Wada, Takahiro [ed.] [Matsushita Electric Industries Co., Ltd., Kyoto (Japan)]; PB: 621 p.; Materials Research Society symposium proceedings, Volume 426
- Country of Publication:
- United States
- Language:
- English
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