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Title: Effects of cryogenic irradiation on temperature sensors

Conference ·
OSTI ID:416762
;  [1]
  1. Lake Shore Cryotronics, Inc., Westerville, OH (United States)

Several types of commercially available cryogenic temperature sensors were calibrated, irradiated at 4.2 K by a gamma or neutron source, and recalibrated in-situ to determine their suitability for thermometry in radiation environments. Comparisons were made between pre- and post-irradiation calibrations with the equivalent temperature shift calculated for each sensor at various temperature in the 4.2 K to 330 K range. Four post-irradiation calibrations were performed with annealing steps performed at 20 K, 80 K, and 330 K. Temperature sensors which were gamma irradiated were given a total dose of 10,000 Gy. Temperature sensors which were neutron irradiated were irradiated to a total fluence of 2 {times} 10{sup 12} n/cm{sup 2}. In general, for gamma radiation environments, diodes are unsuitable for use. Both carbon glass and germanium resistance sensors performed well at lower temperature, while platinum resistance sensors performed best above 30 K. Thin-film rhodium and Cernox{trademark} resistance sensors both performed well over the 4.2 K to 330 K range. Only thin-film rhodium and Cernox{trademark} resistance temperature sensors were neutron irradiated and they both performed well over the 4.2 K to 330 K range.

DOE Contract Number:
AC02-89ER80721; FG02-90ER81074
OSTI ID:
416762
Report Number(s):
CONF-950722-; TRN: 97:001728
Resource Relation:
Conference: CEC/ICMC `95: cryogenic engineering conference and international cryogenic materials conference, Columbus, OH (United States), 17-21 Jul 1995; Other Information: PBD: 1996; Related Information: Is Part Of Advances in cryogenic engineering. Volume 41, Part A & B; Kittel, P. [ed.]; PB: 2037 p.
Country of Publication:
United States
Language:
English