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U.S. Department of Energy
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APPLICATIONS OF SEMI-MARKOV PROCESSES TO COUNTER AND RELIABILITY PROBLEMS. Technical Report No. 57

Technical Report ·
OSTI ID:4139049

Counter and reliability problems were solved using the technique of the embedded semi-Markov process. The determinantal properties of I-P, where P is the transition matrix associated with the semi-Markov process, were related to the stochastic properties of the embedded Markov chain. The first and second moments of the first passage distribution for a finite process were obtained. A new feature of the technique was input processes which were in general non- renewal. The reason for generalizing the input process was that the renewal input assumption was not always realized. A unified treatment was made of a large class of so-called "repairmam problems" which arose in reliability theory. These problems were identified with appropriate stochastic models from queueing and telephone trunking theory. (M.C.G.)

Research Organization:
Stanford Univ., Calif. Applied Mathematics and Statistics Lab.
NSA Number:
NSA-14-019299
OSTI ID:
4139049
Report Number(s):
NP-8851
Country of Publication:
United States
Language:
English

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