Dependence of self-focusing of a high-intensity pulsed electron beam on gaseous media as studied by depth-dose distributions. II. Inorganic polyatomic gases

Journal Article · Tue Jul 01 00:00:00 EDT 1975 · Radiat. Res., v. 63, no. 1, pp. 32-41

DOI:https://doi.org/10.2307/3574305· OSTI ID:4130379

Hotta, H; Tanaka, R; Arai, H

The work on the self-focusing of a pulsed electron beam as studied by depth-dose distributions has now been extended to N$sub 2$, O$sub 2$, N$sub 2$O, CO$sub 2$, and SF$sub 6$. The depth-dose curves in the dosimeter in an atmosphere of these gases below 10 torr enable us to determine the relative total ionization cross sections. In order to test the pinch of the beam above 10 torr, we estimated the rate of the recombination of secondary electrons with positive ions from momentum-transfer cross sections as a function of mean electron energy. Recombination times thus calculated in consideration of thermalization times are consistent with the kinetic scheme for explaining the self-focusing. The multiple scattering of the primary beam above 150 torr is discussed as functions of anti Z (anti Z + 1)M/anti A. (7 figs. 17 refs.) (auth)

• Research Organization: Japan Atomic Energy Research Inst., Takasaki
• Sponsoring Organization: USDOE
• NSA Number: NSA-33-008589
• OSTI ID: 4130379
• Journal Information: Radiat. Res., v. 63, no. 1, pp. 32-41, Other Information: Orig. Receipt Date: 30-JUN-76
• Country of Publication: United States
• Language: English

Related Subjects

N72100* -Physics (Radiation & Shielding)-Radiation Physics
643601*
*ALUMINIUM- ELECTRON DOSIMETRY
*CARBON DIOXIDE- CHARGED-PARTICLE TRANSPORT
*CELLOPHANE- ELECTRON DOSIMETRY
*ELECTRONS- FOCUSING
*NITROGEN OXIDES- CHARGED-PARTICLE TRANSPORT
*NITROGEN- CHARGED-PARTICLE TRANSPORT
*OXYGEN- CHARGED-PARTICLE TRANSPORT
*SULFUR FLUORIDES- CHARGED-PARTICLE TRANSPORT