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Low temperature deposition of metal nitrides by thermal decomposition of organometallic compounds

Journal Article · · J. Electrochem. Soc., v. 122, no. 11, pp. 1545-1549
DOI:https://doi.org/10.1149/1.2134060· OSTI ID:4115502

Decomposition reaction of dialkylamides of boron, silicon, tin, titanium, zirconium, niobium, and tantalum was investigated. The amides of transition metals decomposed to the corresponding nitrides at 300 to 500$sup 0$C, whereas those of boron, silicon, and tin yielded elemental deposits at higher temperatures. In the deposition of titanium nitride from titanium tetrakis (dimethylamide), two optimum temperatures at 400$sup 0$ and at 800$sup 0$C in nitrogen or hydrogen atmosphere were found, but in argon only low temperature deposition was possible. The low and high temperature processes are discussed in relation to mass spectral analysis of the exhaust gases formed at various decomposition temperatures of titanium amide. (auth)

Research Organization:
Gifu Univ., Kagamigahara, Japan
Sponsoring Organization:
USDOE
NSA Number:
NSA-33-017622
OSTI ID:
4115502
Journal Information:
J. Electrochem. Soc., v. 122, no. 11, pp. 1545-1549, Journal Name: J. Electrochem. Soc., v. 122, no. 11, pp. 1545-1549; ISSN JESOA
Country of Publication:
United States
Language:
English