Determination of secondary ionic emission coefficients from secondary ion energy spectra caused by bombardment of PbS and LiF single crystals by helium ions with energy from 20 to 200 eV (in Russian)
Journal Article
·
· Vestn. Leningr. Univ., Fiz., Khim., no. 1, pp. 53-55
OSTI ID:4114080
- Research Organization:
- Originating Research Org. not identified
- NSA Number:
- NSA-33-012954
- OSTI ID:
- 4114080
- Journal Information:
- Vestn. Leningr. Univ., Fiz., Khim., no. 1, pp. 53-55, Other Information: Orig. Receipt Date: 30-JUN-76
- Country of Publication:
- Sudan
- Language:
- Russian
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ANGULAR DEPENDENCE OF THE SECONDARY ELECTRON EMISSION COEFFICIENT OF SINGLE- CRYSTAL SILICON IN THE RANGE OF INCIDENT ELECTRON ENERGY FROM 100 TO 2000 eV.
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OSTI ID:4114080
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OSTI ID:4114080