Electron Microscope Observations of Fission Fragment Tracks in Thin Films of UO₂

Journal Article · Fri Jan 01 00:00:00 EST 1960 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.1735523· OSTI ID:4100040

Noggle, T. S.; Stiegler, J. O.

Electron microscope studies of the tracks produced by fission fragments in thin films of UO₂ established a 100% detection efficiency for fission events in films 100 A or less in thickness. A background texture decreases the efficiency in thicker films. The tracks register in the films primarily as a result of a redistribution of surface material arising from the disturbance produced by the continuous loss of energy of the fragment by electron excitation and ionization. The minimum rats of energy loss which registers as a track in the film is on the order of 1000 ev/A. Track length distributions, however, suggest that as yet unrecognized free surface effects may also contribute to the track registration.

• Research Organization: Oak Ridge National Lab., Tenn.
• Sponsoring Organization: USDOE
• NSA Number: NSA-15-009581
• OSTI ID: 4100040
• Journal Information: Journal of Applied Physics, Vol. 31, Issue 12; Other Information: Orig. Receipt Date: 31-DEC-61; ISSN 0021-8979
• Publisher: American Institute of Physics (AIP)
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BACKGROUND
DETECTION
DISTRIBUTION
EFFICIENCY
ELECTRON MICROSCOPY
ELECTRONS
ENERGY
EXCITATION
FILMS
FISSION PRODUCTS
IONIZATION
LOSSES
PARTICLE TRACKS
SURFACES
THICKNESS
URANIUM DIOXIDE