Low frequency noise in superconducting Sn films at the transition temperature

Conference · Sat Mar 01 04:00:00 EDT 1975 · IEEE Trans. Magn., v. MAG-11, no. 2, pp. 845-847

OSTI ID:4094478

Clarke, J; Hsiang, T Y

The noise power spectrum was measured for tin films evaporated on glass substrates biased at the transition temperature. The spectrum is close to 1/f between 0.1 and 1000 Hz. The noise is found to be correlated over a correlation length (D/$pi$f)/sup $sup 1$$/$$sub 2$/, where D is the diffusivity of tin film. Studies were also made of samples in which a thin layer of aluminum was predeposited before tin evaporation. The aluminum layer appears to greatly reduce the thermal boundary resistance between tin and the substrate. The amplitude of noise for such samples is greatly reduced below 10 Hz, where it is almost independent of frequency. These results are in accord with the thermal diffusion theory proposed by Clarke and Voss and should have important implications on future construction of superconducting bolometers. (auth)

• Research Organization: Univ. of California, Berkeley
• NSA Number: NSA-33-017119
• OSTI ID: 4094478
• Conference Information: Journal Name: IEEE Trans. Magn., v. MAG-11, no. 2, pp. 845-847
• Country of Publication: United States
• Language: English

Related Subjects

*SUPERCONDUCTING FILMS-- NOISE
420201* --Engineering--Facilities & Equipment--Cryogenic & Superconducting Equipment & Devices
ALUMINIUM
BOUNDARY LAYERS
FREQUENCY DEPENDENCE
GLASS
N42220* --Engineering--Facilities & Equipment--Cryogenic & Superconducting Equipment & Devices
SUBSTRATES
TIN