APPLICATION OF SEMICONDUCTOR DETECTORS FOR X-RAY FLUORESCENT ANALYSIS. (in Polish)
Technical Report
·
OSTI ID:4088872
- Research Organization:
- Institute of Nuclear Research, Warsaw (Poland)
- NSA Number:
- NSA-25-032211
- OSTI ID:
- 4088872
- Report Number(s):
- INR--1274
- Country of Publication:
- Poland
- Language:
- Polish
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Related Subjects
CONTENT ANALYSIS
FLUORESCENCE
N20110 --Chemistry--Analytical & Separations Chemistry--Chemical Procedures
N26110* --Instrumentation--Radiation Detection Instruments-- General Detectors & Monitors
RESOLUTION
SEMICONDUCTOR COUNTERS
SILICON
X RADIATION
X-RAY FLUORESCENCE ANALYSIS/equipment for
performance of lithium-drifted silicon spectrometer
X-RAY SPECTRA
X-RAY SPECTROMETERS/resolution of lithium-drifted silicon
for fluorescence analysis
FLUORESCENCE
N20110 --Chemistry--Analytical & Separations Chemistry--Chemical Procedures
N26110* --Instrumentation--Radiation Detection Instruments-- General Detectors & Monitors
RESOLUTION
SEMICONDUCTOR COUNTERS
SILICON
X RADIATION
X-RAY FLUORESCENCE ANALYSIS/equipment for
performance of lithium-drifted silicon spectrometer
X-RAY SPECTRA
X-RAY SPECTROMETERS/resolution of lithium-drifted silicon
for fluorescence analysis