PULSED NUCLEAR RADIATION EFFECTS ON ELECTRONIC PARTS AND MATERIALS. (SPRF NO. 1)

Technical Report · Sat Sep 01 04:00:00 EDT 1962

OSTI ID:4083693

Schlosser, W; Lascaro, C P; Key, J

The results of a recent series of experiments conducted on electronic parts at the Sandia Pulsed Reactor Facility are discussed. Cables, resistors, and ferrite cores were included in the program. Four cables including RG-62A/U, RG-59B/U, RG-81/U, and a twisted pair line cord were exposed in various geometries, circuits, and applied voltages. Exposed also were 100-ohm, 1-kohm, 10-kohm, and 100kohm carbon film resistors, a 100-ohm wire wound resistor, as well as manganese-- zinc and nickel- zinc ferrite cores. Peak induced currents observed in cables were; +3000 to -2650 microamp in looped RG-81/U, +600 to -2500 microamp in looped RG-62A/U, +300 to --380 microamp in looped RG-59B/U, +400 to - 1650 microamp in looped twisted pair, +80 to -90 microamp in straight potted RG- 62A/U, and +800 to -500 microamp in straight unpotted RG-62A/U cable. Low-value resistors appeared quite stable, but resistors greater in value than 10 kohm showed a spurious and inconsistent behavior, attributed largely to lead cable efforts. The measurements on cables and resistors seem to bear out the fact that reliable data cannot yet be obtained for many exposed component parts because of the unpredictable behavior of the cables used for signal transmission. (auth)

• Research Organization: Army Electronics Research and Development Lab., Fort Monmouth, N.J.
• NSA Number: NSA-18-014544
• OSTI ID: 4083693
• Report Number(s): USAELRDL-TR-2306; AD-412556
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

CABLES
CARBON
CIRCUITS
CONFIGURATION
CURRENTS
ELECTRIC POTENTIAL
ELECTRONIC EQUIPMENT
FILMS
IRON OXIDES
MANGANESE
MATERIALS TESTING
MEASURED VALUES
METALS, CERAMICS, AND OTHER MATERIALS
NICKEL
PULSES
RADIATION EFFECTS
REACTORS
RESEARCH REACTORS
RESISTORS
SIGNALS
SPRF
TRANSDUCERS
WIRES
ZINC