CONTINUOUS LAYER THICKNESS MEASUREMENT OF THIN ORGANIC COATINGS ON LIGHT METALS OR ALLOYS USING AN ELECTRON BACKSCATTERING GAUGE. (in French)
Journal Article
·
· Rev. Phys. Appl. 5: 317-20(Apr 1970).
OSTI ID:4078692
- Research Organization:
- Clermont-Ferrand Univ., France
- NSA Number:
- NSA-24-048338
- OSTI ID:
- 4078692
- Journal Information:
- Rev. Phys. Appl. 5: 317-20(Apr 1970)., Other Information: Orig. Receipt Date: 31-DEC-70
- Country of Publication:
- France
- Language:
- French
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Related Subjects
N26300* -Instrumentation-Radiometric Instruments
ALLOYS
BACKSCATTERING
BETA PARTICLES
BETA SOURCES
COATING
ELECTRONS
HELIUM
LAYERS
METALS
OPERATION
ORGANIC COMPOUNDS
PARTICLE SOURCES
PERFORMANCE
RADIOMETRIC GAGES
SCATTERING
SURFACES
THICKNESS
COATINGS/thickness measurements of thin organic
on metals
electron backscattering gage for
THICKNESS GAGES/operation and performance of beta backscatter
for thin organic coatings on metals
ALLOYS
BACKSCATTERING
BETA PARTICLES
BETA SOURCES
COATING
ELECTRONS
HELIUM
LAYERS
METALS
OPERATION
ORGANIC COMPOUNDS
PARTICLE SOURCES
PERFORMANCE
RADIOMETRIC GAGES
SCATTERING
SURFACES
THICKNESS
COATINGS/thickness measurements of thin organic
on metals
electron backscattering gage for
THICKNESS GAGES/operation and performance of beta backscatter
for thin organic coatings on metals