PLASMA ACCUMULATION IN A DEVICE FED BY ENERGETIC-ION TRAPPING
Plasma accumulation (without energy losses) in a device in which energetic ions are injected and trapped is discussed. A previous general steady- state theory for devices, such as the OGRA device, where trapping is initiated by interactions with background gas is noted. For such devices there is usually a critical input current or critical plasma density (a function of input current) above which plasma density builds up to a value limited by Coulomb scattering losses. For a specific regime of operation (600 kev hydrogen molecular ion injection and dissociation, highly efficient ion-pumping action of the trapped plasma), simple approximate formulas are derived that describe the critical current or density for plasma build-up. Secondapproximation formulas are derived that describe with about 10% error the overlapping segaients of the density versus current curve for a broad range of parameters. The analysis is applied to a system in which the initial trapping is accomplished by a Luce carbon arc, e.g., DCX-2. It is found that if the arc is turned off slowly or if an arc of lower density. is used, then the critical current for plasma build-up with arc is nearly an order of magnitude less than previously estimated; and that the critical arc density, below which plasma build-up occurs after the arc is removed, is sufficiently low that energy losses to fixed-temperature arc electrons are not significant. The time-dependence of plasma build-up, certain aspects of the impurity problem, snd electron heating effects are also considered. Numerical examples are given for OGRA and DCX-2. (auth)
- Research Organization:
- Oak Ridge National Lab., Tenn.
- Sponsoring Organization:
- USDOE
- NSA Number:
- NSA-15-021654
- OSTI ID:
- 4060765
- Journal Information:
- Nuclear Fusion, Journal Name: Nuclear Fusion Vol. Vol: 1: No. 2
- Country of Publication:
- Country unknown/Code not available
- Language:
- English
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