Possible cause of the memory effect observed in nickel-cadmium secondary batteries

Journal Article · Tue Oct 01 00:00:00 EDT 1996 · Journal of the Electrochemical Society

DOI:https://doi.org/10.1149/1.1837152· OSTI ID:404646

Sato, Yuichi; Ito, Katuhiko; Arakawa, Takumi; Kobayakawa, Koichi ^[1]

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1. Kanagawa Univ., Yokohama (Japan). Dept. of Applied Chemistry

After repeated shallow discharging and overcharging of nickel or cadmium capacity-limited cells, a working voltage lowering of the discharge curve was observed. The magnitude of the lowering was higher in the nickel capacity-limited cells. The X-ray diffraction pattern of the charged-state normal nickel electrode contained diffraction peaks due only to {beta}-NiOOH. A charges-state nickel electrode showing a lowered discharge voltage and diffraction peaks due to {gamma}-NiOOH, in addition to those due to {beta}-NiOOH. This may be a cause of the memory effect observed in practical nickel-cadmium batteries.

• Sponsoring Organization: USDOE
• OSTI ID: 404646
• Journal Information: Journal of the Electrochemical Society, Journal Name: Journal of the Electrochemical Society Journal Issue: 10 Vol. 143; ISSN 0013-4651; ISSN JESOAN
• Country of Publication: United States
• Language: English

Related Subjects

25 ENERGY STORAGE
BATTERY CHARGING
NICKEL OXIDES
NICKEL-CADMIUM BATTERIES
PERFORMANCE
PHASE STUDIES
SERVICE LIFE
VOLTAGE DROP