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New small-angle x-ray scattering facility utilizing a rotating anode, pin- hole collimation and a position-sensitive proportional counter

Journal Article · · J. Appl. Crystallogr., v. 8, pp. 421-429
A new small-angle X-ray scattering facility which utilizes a 6 kW rotating anode, pin-hole collimation, and a position-sensitive proportional counter has been developed. As presently constructed, the minimum scattering vector k (=4$pi$ sin theta/lambda) which can be reached with Cu K$alpha$ radiation is 5 x 10$sup -3$ A$sup -$1. Under these conditions the flux incident on the specimen has been found to be 6 x 10$sup 5$ photons s$sup -1$. The system has several advantages compared with traditional long-slit geometries; namely, (i) it can quantitatively measure anisotropic scattering distributions, (ii) it avoids large mathematical corrections of the data for slit-smearing effects, and (iii) it minimizes double Braggscattering in crystalline materials and multiple diffuse scattering in amorphous or liquid materials. To illustrate the performance of this instrument, the scattering curves obtained from four widely different samples are shown. These are: polyethylene, a neutron-irradiated aluminum single crystal containing voids, a dilute suspension of Ludox spheres, and duck tendon collagen. Quantitative comparisons of the performance with a Kratky camera and with the neutron small-angle scattering facility in Juelich are given. (auth)
Research Organization:
Oak Ridge National Lab., TN
NSA Number:
NSA-33-029447
OSTI ID:
4044236
Journal Information:
J. Appl. Crystallogr., v. 8, pp. 421-429, Journal Name: J. Appl. Crystallogr., v. 8, pp. 421-429; ISSN JACGA
Country of Publication:
Denmark
Language:
English