X-ray resonant Raman scattering in NiO: Resonant enhancement of the charge-transfer excitations

Journal Article · Sat Nov 30 23:00:00 EST 1996 · Physical Review, B: Condensed Matter

DOI:https://doi.org/10.1103/PhysRevB.54.16361· OSTI ID:404019

Kao, C; Caliebe, W A; Hastings, J B ^[1]; Gillet, J ^[2]

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1. National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973 (United States)
2. Department of Material Science, Universite de Marne la Vallee, 93166 Noisy le Grand Cedex (France)

An energy loss feature with energy transfer close to the anion-to-cation charge-transfer energy of NiO is observed in the inelastic-x-ray-scattering spectrum as the incident x-ray energy is tuned through the Ni {ital K} absorption edge of NiO. The inelastic-scattering cross section shows large resonant enhancement and strong incident energy dependence. These observations are interpreted using a configuration-interaction cluster model of NiO. {copyright} {ital 1996 The American Physical Society.}

• Research Organization: Brookhaven National Laboratory
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 404019
• Journal Information: Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 23 Vol. 54; ISSN 0163-1829; ISSN PRBMDO
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
66 PHYSICS
CROSS SECTIONS
ELECTRON TRANSFER
ELECTRONIC STRUCTURE
ENERGY DEPENDENCE
ENERGY-LOSS SPECTROSCOPY
NICKEL OXIDES
RAMAN EFFECT
RESONANCE SCATTERING
X-RAY SPECTRA