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Title: Portable long trace profiler: Concept and solution

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1384452· OSTI ID:40277815

Since the early development of the penta-prism long trace profiler (LTP) and the in situ LTP, and following the completion of the first in situ distortion profile measurements at Sincrotrone Trieste (ELETTRA) in Italy in 1995, a concept was developed for a compact, portable LTP with the following characteristics: easily installed on synchrotron radiation beam lines, easily carried to different laboratories around the world for measurements and calibration, convenient for use in evaluating the LTP as an in-process tool in the optical workshop, and convenient for use in temporarily installation as required by other special applications. The initial design of a compact LTP optical head was made at ELETTRA in 1995. Since 1997 further efforts to reduce the optical head size and weight, and to improve measurement stability have been made at Brookhaven National Laboratory. This article introduces the following solutions and accomplishments for the portable LTP: (1) a new design for a compact and very stable optical head, (2) the use of a small detector connected to a laptop computer directly via an enhanced parallel port, and there is no extra frame grabber interface and control box, (3) a customized small mechanical slide that uses a compact motor with a connector-sized motor controller, and (4) the use of a laptop computer system. These solutions make the portable LTP able to be packed into two laptop-size cases: one for the computer and one for the rest of the system.

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Organization:
(US)
DOE Contract Number:
AC02-98CH10886
OSTI ID:
40277815
Journal Information:
Review of Scientific Instruments, Vol. 72, Issue 8; Other Information: DOI: 10.1063/1.1384452; Othernumber: RSINAK000072000008003198000001; 025108RSI; PBD: Aug 2001; ISSN 0034-6748
Publisher:
The American Physical Society
Country of Publication:
United States
Language:
English

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