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Title: Magnetic imaging of ion-irradiation patterned Co/Pt multilayers using complementary electron and photon probes

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.1407301· OSTI ID:40277747

The three-dimensional magnetic structure and reversal mechanism of patterned Co/Pt multilayers, were imaged using complementary Lorentz transmission electron microscopy (in-plane component) and magnetic transmission x-ray microscopy (perpendicular magnetization). The Co/Pt films with perpendicular anisotropy were patterned by ion irradiation through a stencil mask to produce in-plane magnetization in the irradiated regions. The boundaries of the patterns, defined by the transition from out-of-plane to in-plane magnetization, were found to be determined by the stencil mask. The nucleation fields were substantially reduced to 50 Oe for the in-plane regions and 1 kOe for the perpendicular regions, comparing to 4.5 kOe for the as-grown film. The perpendicular reversals were found to always originate at the pattern boundaries.

Research Organization:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
(US)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
40277747
Report Number(s):
LBNL-46717; TRN: US0110280
Journal Information:
Applied Physics Letters, Vol. 79, Issue 14; Other Information: DOI: 10.1063/1.1407301; Othernumber: APPLAB000079000014002211000001; 030140APL; PBD: 1 Oct 2001; ISSN 0003-6951
Publisher:
The American Physical Society
Country of Publication:
United States
Language:
English