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Title: X-ray photoelectron spectroscopy study of irradiation-induced amorphizaton of Gd{sub 2}Ti{sub 2}O{sub 7}

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.1402647· OSTI ID:40277739

The radiation-induced evolution of the microstructure of Gd{sub 2}Ti{sub 2}O{sub 7}, an important pyrochlore phase in radioactive waste disposal ceramics and a potential solid electrolyte and oxygen gas sensor, has been characterized using transmission electron microscopy and x-ray photoelectron spectroscopy. Following the irradiation of a Gd{sub 2}Ti{sub 2}O{sub 7} single crystal with 1.5 MeV Xe{sup +} ions at a fluence of 1.7 x 10{sup 14} Xe{sup +}/cm{sup 2}, cross-sectional transmission electron microscopy revealed a 300-nm-thick amorphous layer at the specimen surface. X-ray photoelectron spectroscopy analysis of the Ti 2p and O 1s electron binding energy shifts of Gd{sub 2}Ti{sub 2}O{sub 7} before and after amorphization showed that the main results of ion-irradiation-induced disorder are a decrease in the coordination number of titanium and a transformation of the Gd--O bond. These features resemble those occurring in titanate glass formation, and they have implications for the chemical stability and electronic properties of pyrochlores subjected to displacive radiation damage.

Research Organization:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
(US)
DOE Contract Number:
AC05-00OR22725; FG02-97ER45656
OSTI ID:
40277739
Journal Information:
Applied Physics Letters, Vol. 79, Issue 13; Other Information: DOI: 10.1063/1.1402647; Othernumber: APPLAB000079000013001989000001; 039137APL; PBD: 24 Sep 2001; ISSN 0003-6951
Publisher:
The American Physical Society
Country of Publication:
United States
Language:
English