X-ray photoelectron spectroscopy study of irradiation-induced amorphizaton of Gd{sub 2}Ti{sub 2}O{sub 7}
The radiation-induced evolution of the microstructure of Gd{sub 2}Ti{sub 2}O{sub 7}, an important pyrochlore phase in radioactive waste disposal ceramics and a potential solid electrolyte and oxygen gas sensor, has been characterized using transmission electron microscopy and x-ray photoelectron spectroscopy. Following the irradiation of a Gd{sub 2}Ti{sub 2}O{sub 7} single crystal with 1.5 MeV Xe{sup +} ions at a fluence of 1.7 x 10{sup 14} Xe{sup +}/cm{sup 2}, cross-sectional transmission electron microscopy revealed a 300-nm-thick amorphous layer at the specimen surface. X-ray photoelectron spectroscopy analysis of the Ti 2p and O 1s electron binding energy shifts of Gd{sub 2}Ti{sub 2}O{sub 7} before and after amorphization showed that the main results of ion-irradiation-induced disorder are a decrease in the coordination number of titanium and a transformation of the Gd--O bond. These features resemble those occurring in titanate glass formation, and they have implications for the chemical stability and electronic properties of pyrochlores subjected to displacive radiation damage.
- Research Organization:
- Oak Ridge National Laboratory
- Sponsoring Organization:
- (US)
- DOE Contract Number:
- AC05-00OR22725; FG02-97ER45656
- OSTI ID:
- 40277739
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 13 Vol. 79; ISSN 0003-6951
- Publisher:
- The American Physical Society
- Country of Publication:
- United States
- Language:
- English
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