Multiple-beam x-ray diffraction near exact backscattering in silicon
We examined multiple-beam effects accompanying a backscattering Bragg reflection from a silicon crystal. Silicon crystals are frequently used in x-ray diffraction applications due to their high degree of perfection. Backscattering Bragg reflections have been employed for x-ray monochromatization, energy analysis, and other tasks. Multiple-beam effects have been found to be unavoidable for backscattering of hard x-rays from silicon, but little experimental data had previously been collected on these effects. Detailed rocking curves of the (12 4 0) Bragg reflection near backscattering are included and compared to the predictions of the dynamical diffraction theory. Intensity data of the accompanying reflected beams are also provided.
- Sponsoring Organization:
- (US)
- OSTI ID:
- 40205576
- Journal Information:
- Physical Review B, Vol. 63, Issue 9; Other Information: DOI: 10.1103/PhysRevB.63.094111; Othernumber: PRBMDO000063000009094111000001; 010109PRB; PBD: 1 Mar 2001; ISSN 0163-1829
- Publisher:
- The American Physical Society
- Country of Publication:
- United States
- Language:
- English
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