Directional shear force microscopy

Journal Article · Sun Jan 14 23:00:00 EST 2001 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.1341225· OSTI ID:40205264

Burns, A R; Carpick, R W

We describe a technique, based on shear force microscopy, that allows one to detect shear forces in a chosen direction at the nanometer scale. The lateral direction of an oscillating probe tip is determined by selecting which of the four quadrants are excited on the piezo driver. The shear forces depend directly on this lateral direction if structural anisotropies are present, as confirmed with polydiacetylene monolayers.

• Sponsoring Organization: (US)
• OSTI ID: 40205264
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 3 Vol. 78; ISSN 0003-6951
• Publisher: The American Physical Society
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
MICROSCOPY
PHYSICS
PROBES
SHEAR