Neutron diffraction study on the defect structure of indium--tin--oxide
The defect structure of undoped and Sn-doped In{sub 2}O{sub 3} (ITO) materials was studied by preparing powders under different processing environments and performing neutron powder diffraction. The effect of tin doping and oxygen partial pressure was determined. Structural information was obtained by analyzing neutron powder diffraction data using the Rietveld method. The results include positions of the atoms, their thermal displacements, the fractional occupancy of the interstitial oxygen site, and the fractional occupancies of Sn on each of the two nonequivalent cation sites. The tin cations show a strong preference for the b site versus the d site. The measured electrical properties are correlated with the interstitial oxygen populations, which agree with the proposed models for reducible (2Sn{sub In}{sup .}O{sub i}''){sup x} and nonreducible (2Sn{sub In}{sup .}3O{sub O}O{sub i}''){sup x} defect clusters.
- Sponsoring Organization:
- (US)
- OSTI ID:
- 40204926
- Journal Information:
- Journal of Applied Physics, Vol. 89, Issue 5; Other Information: DOI: 10.1063/1.1341209; Othernumber: JAPIAU000089000005002550000001; 003105JAP; PBD: 1 Mar 2001; ISSN 0021-8979
- Publisher:
- The American Physical Society
- Country of Publication:
- United States
- Language:
- English
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