X-ray interferometry with spherically bent crystals (abstract)
Journal Article
·
· Review of Scientific Instruments
Recent progress in manufacturing high-quality spherically bent crystals allows highly monochromatic x-ray beams to be produced, and allows efficient x-ray imaging with {mu}m-scale resolution. This article explores some of the constraints for x-ray interferometry utilizing spherically bent crystals and laser-produced plasma sources, and discusses several shearing interferometer concepts that might be experimentally investigated.
- Sponsoring Organization:
- (US)
- OSTI ID:
- 40204781
- Journal Information:
- Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 1 Vol. 72; ISSN 0034-6748
- Publisher:
- The American Physical Society
- Country of Publication:
- United States
- Language:
- English
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