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Title: Harmonic and power balance tools for tapping-mode atomic force microscope

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.1365440· OSTI ID:40203785

The atomic force microscope (AFM) is a powerful tool for investigating surfaces at atomic scales. Harmonic balance and power balance techniques are introduced to analyze the tapping-mode dynamics of the atomic force microscope. The harmonic balance perspective explains observations hitherto unexplained in the AFM literature. A nonconservative model for the cantilever{endash}sample interaction is developed. The energy dissipation in the sample is studied and the resulting power balance equations combined with the harmonic balance equations are used to estimate the model parameters. Experimental results confirm that the harmonic and power balance tools can be used effectively to predict the behavior of the tapping cantilever. {copyright} 2001 American Institute of Physics.

Sponsoring Organization:
(US)
OSTI ID:
40203785
Journal Information:
Journal of Applied Physics, Vol. 89, Issue 11; Other Information: DOI: 10.1063/1.1365440; Othernumber: JAPIAU000089000011006473000001; 074110JAP; PBD: 1 Jun 2001; ISSN 0021-8979
Publisher:
The American Physical Society
Country of Publication:
United States
Language:
English

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