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Phase-field simulations of dendritic crystal growth in a forced flow

Journal Article · · Physical Review E
Convective effects on free dendritic crystal growth into a supercooled melt in two dimensions are investigated using the phase-field method. The phase-field model incorporates both melt convection and thermal noise. A multigrid method is used to solve the conservation equations for flow. To fully resolve the diffuse interface region and the interactions of dendritic growth with flow, both the phase-field and flow equations are solved on a highly refined grid where up to 2.1 million control volumes are employed. A multiple time-step algorithm is developed that uses a large time step for the flow-field calculations while reserving a fine time step for the phase-field evolution. The operating state (velocity and shape) of a dendrite tip in a uniform axial flow is found to be in quantitative agreement with the prediction of the Oseen-Ivantsov transport theory if a tip radius based on a parabolic fit is used. Furthermore, using this parabolic tip radius, the ratio of the selection parameters without and with flow is shown to be close to unity, which is in agreement with linearized solvability theory for the ranges of the parameters considered. Dendritic sidebranching in a forced flow is also quantitatively studied. Compared to a dendrite growing at the same supercooling in a diffusive environment, convection is found to increase the amplitude and frequency of the sidebranches. The phase-field results for the scaled sidebranch amplitude and wavelength variations with distance from the tip are compared to linear Wentzel-Kramers-Brillouin theory. It is also shown that the asymmetric sidebranch growth on the upstream and downstream sides of a dendrite arm growing at an angle with respect to the flow can be explained by the differences in the mean shapes of the two sides of the arm.
Sponsoring Organization:
(US)
OSTI ID:
40203262
Journal Information:
Physical Review E, Journal Name: Physical Review E Journal Issue: 6 Vol. 63; ISSN 1063-651X
Publisher:
The American Physical Society
Country of Publication:
United States
Language:
English

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