Refraction contrast imaging with a scanning microlens
We demonstrate subwavelength spatial resolution with a scanning microlens operating in collection mode with a large-area detector. Optical contrast is created by refraction of off-axis light rays at angles larger than the maximum collection angle. With a microfabricated silicon microlens 10 {mu}m in diameter, we measure spatial resolution due to refraction contrast of {lambda}/4.3 at a wavelength of {lambda}=10.7 {mu}m. A model based on ray tracing is developed to explain our result, and we show that lens diameter and index of refraction limit resolution for large emission and collection angles. {copyright} 2001 American Institute of Physics.
- Sponsoring Organization:
- (US)
- OSTI ID:
- 40203161
- Journal Information:
- Applied Physics Letters, Vol. 78, Issue 23; Other Information: DOI: 10.1063/1.1377318; Othernumber: APPLAB000078000023003589000001; 010123APL; PBD: 4 Jun 2001; ISSN 0003-6951
- Publisher:
- The American Physical Society
- Country of Publication:
- United States
- Language:
- English
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