X-Ray Based Subpicosecond Electron Bunch Characterization Using 90{degree} Thomson Scattering
- Ernest Orlando Lawrence Berkeley National Laboratory, University of California at Berkeley, Berkeley, California 94720 (United States)
X rays produced by 90{degree} Thomson scattering of a femtosecond, near infrared, terawatt laser pulse of a 50 MeV electron beam are shown to be an effective diagnostic to measure transverse and longitudinal density distributions of an electron beam ({ital e} beam) with subpicosecond time resolution. The laser beam was focused onto the {ital e}-beam waist, generating 30 keV x rays in the forward direction. The transverse and longitudinal {ital e}-beam structures have been obtained by measuring the intensity of the x-ray beam, while scanning the laser beam across the {ital e} beam in space and time. The {ital e}-beam divergence has been obtained through measurement of spatial and spectral characteristics of the scattered x-ray beam. {copyright} {ital 1996 The American Physical Society.}
- Research Organization:
- Lawrence Berkeley National Laboratory
- DOE Contract Number:
- AC03-76SF00098; FG03-95ER40936
- OSTI ID:
- 397645
- Journal Information:
- Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 20 Vol. 77; ISSN 0031-9007; ISSN PRLTAO
- Country of Publication:
- United States
- Language:
- English
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