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Title: Electron-scattering measurements using a magneto-optical trap

Journal Article · · Bulletin of the American Physical Society
OSTI ID:394120
 [1]
  1. Univ. of Wisconsin, Madison, WI (United States)

Optically trapped atoms are in many ways ideal replacements for atomic beams for scattering experiments. In a typical such experiment, a particle beam ejects atoms from the trap at a rate {Gamma} = {sigma}{phi}, where {phi} is the particle flux density and {sigma} the scattering cross section. {Gamma} is easily measured from trap decay transients. Since the trapped atoms have neV kinetic energies, the method is sensitive to extremely small momentum transfers. Since the beam flux is measured, the absolute target density is not required, removing an important source of error for most atomic beam experiments. At Wisconsin the authors have integrated an electron beam with a magneto-optical trap and performed electron-scattering experiments on Rb atoms in the range of 10-1000 eV. In the first experiment they measured total cross sections for scattering from the 5s state by lowering the capture velocity of the trap below the recoil velocity of the scattered atoms. In the second experiment they isolated the total ionization cross section by operating the trap such that virtually all elastically and inelastically scattered atoms were captured by the trap. These experimental results will test new theoretical methods for calculating total and ionization cross sections. Straightforward extensions of these methods should allow similar measurements using excited-state atoms (5p, 5d) as well. The techniques should also be readily adaptable to the important case of the metastable noble gases.

OSTI ID:
394120
Report Number(s):
CONF-9605105-; ISSN 0003-0503; TRN: 96:028783
Journal Information:
Bulletin of the American Physical Society, Vol. 41, Issue 3; Conference: 27. annual meeting of the Division of Atomic, Molecular and Optical Physics (DAMOP) of the American Physical Society (APS), Ann Arbor, MI (United States), 15-18 May 1996; Other Information: PBD: May 1996
Country of Publication:
United States
Language:
English

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