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Title: Three-dimensional interaction effects in internally multicracked pressurized thick-walled cylinder. Part 2: Longitudinal coplanar crack arrays

Journal Article · · Journal of Pressure Vessel Technology
DOI:https://doi.org/10.1115/1.2842201· OSTI ID:390221
;  [1];  [2]
  1. Florida International Univ., Miami, FL (United States). Dept. of Mechanical Engineering
  2. Ben-Gurion Univ. of the Negev, Beer-Sheva (Israel)

In the first part of this paper, the interaction effects among many radial, internal, semi-circular, and semi-elliptical cracks in a pressurized, thick-walled vessel were quantified. In the present paper, the mode 1 stress intensity factor (SIF) distribution for numerous longitudinal coplanar, internal, semi-circular, and semi-elliptical arrays of surface cracks in an infinite, pressurized, thick-walled cylinder are evaluated. The 3-D analysis is performed by the finite element (FE) method and the submodeling technique, employing singular elements along the crack front. The effects f dense and sparse interacting longitudinal coplanar crack arrays on the SIFs are studied for a wide range of crack depth to wall thickness ratios, a/t, from 0.05 to 0.6; and, for various ellipticities of the crack, i.e., the ratio of the crack depth to semi-crack length, a/c, from 0.2 to 2.0. An analysis is performed to determine the influence of the three major parameters--crack density, crack ellipticity, and crack depth--on the interaction effects between adjacent cracks. The results clearly indicate that crack density, and, in some cases, ellipticity have opposing effects on the SIF of longitudinal crack arrays as compared to radial crack arrays. As a result of these contrasting behaviors, thick-walled cylinders having combined longitudinal and radial crack arrays would need further study.

Sponsoring Organization:
USDOE
OSTI ID:
390221
Journal Information:
Journal of Pressure Vessel Technology, Vol. 118, Issue 3; Other Information: DN: Paper presented at the Pressure Vessels and Piping Conference, Honolulu, HI (US), July 23--27, 1995; PBD: Aug 1996
Country of Publication:
United States
Language:
English