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Title: A system for single-crystal elastic and inelastic x-ray scattering studies of condensed gases at pressures to 300 MPa and temperatures to 4 K

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1147358· OSTI ID:389579
;  [1]
  1. Frederick Seitz Materials Research Laboratory and Department of Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801-3080 (United States)

A versatile system, operating at pressures to 300 MPa and temperatures to 4 K, has been designed and used for a variety of elastic and inelastic x-ray scattering studies of single crystals of condensed gases. Sintered Be sample cells of volumes 15{endash}30 mm{sup 3} are used. Pressure generation is clean and well controlled. Excellent temperature control allows monitoring of phase transitions associated with solidification and melting. The system has very low background and, combined with the high-intensity of synchrotron radiation, is well suited to studies of low-intensity signals. It has been used for {sup 4}He in {ital q}-dependent studies of fcc lattice dynamics and diffuse scattering and to study thermal defect properties through lattice parameter measurements. In addition, its application to inelastic scattering studies of hcp {sup 4}He at 1.5 eV and 10 meV resolution have yielded results about electronic and phonon excitations, respectively. The system can also be used to study other crystalline compounds; in particular, an application has been made to lattice parameter measurements on C{sub 2}F{sub 6}. {copyright} {ital 1996 American Institute of Physics.}

Research Organization:
Univ. of Illinois at Urbana-Champaign, IL (United States)
DOE Contract Number:
FG02-91ER45439
OSTI ID:
389579
Report Number(s):
CONF-9510119-; ISSN 0034-6748; TRN: 96:027990
Journal Information:
Review of Scientific Instruments, Vol. 67, Issue 9; Conference: SRI `95: synchrotron radiation instrumentation symposium and the 7. users meeting for the advanced photon source (APS), Argonne, IL (United States), 16-20 Oct 1995; Other Information: PBD: Sep 1996
Country of Publication:
United States
Language:
English