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Title: Calibration of frictional forces in atomic force microscopy

Abstract

The atomic force microscope can provide information on the atomic-level frictional properties of surfaces, but reproducible quantitative measurements are difficult to obtain. Parameters that are either unknown or difficult to precisely measure include the normal and lateral cantilever force constants (particularly with microfabricated cantilevers), the tip height, the deflection sensor response, and the tip structure and composition at the tip-surface contact. We present an {ital in} {ital situ} experimental procedure to determine the response of a cantilever to lateral forces in terms of its normal force response. This procedure is quite general. It will work with any type of deflection sensor and does not require the knowledge or direct measurement of the lever dimensions or the tip height. In addition, the shape of the tip apex can be determined. We also discuss a number of specific issues related to force and friction measurements using optical lever deflection sensing. We present experimental results on the lateral force response of commercially available V-shaped cantilevers. Our results are consistent with estimates of lever mechanical properties using continuum elasticity theory. {copyright} {ital 1996 American Institute of Physics.}

Authors:
; ;  [1]
  1. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
Publication Date:
OSTI Identifier:
389518
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 67; Journal Issue: 9; Other Information: PBD: Sep 1996
Country of Publication:
United States
Language:
English
Subject:
44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; MICROSCOPES; CALIBRATION; SLIDING FRICTION; STATIC LOADS; PROBES; MEASURING METHODS; INTERFACES

Citation Formats

Ogletree, D F, Carpick, R W, and Salmeron, M. Calibration of frictional forces in atomic force microscopy. United States: N. p., 1996. Web. doi:10.1063/1.1147411.
Ogletree, D F, Carpick, R W, & Salmeron, M. Calibration of frictional forces in atomic force microscopy. United States. doi:10.1063/1.1147411.
Ogletree, D F, Carpick, R W, and Salmeron, M. Sun . "Calibration of frictional forces in atomic force microscopy". United States. doi:10.1063/1.1147411.
@article{osti_389518,
title = {Calibration of frictional forces in atomic force microscopy},
author = {Ogletree, D F and Carpick, R W and Salmeron, M},
abstractNote = {The atomic force microscope can provide information on the atomic-level frictional properties of surfaces, but reproducible quantitative measurements are difficult to obtain. Parameters that are either unknown or difficult to precisely measure include the normal and lateral cantilever force constants (particularly with microfabricated cantilevers), the tip height, the deflection sensor response, and the tip structure and composition at the tip-surface contact. We present an {ital in} {ital situ} experimental procedure to determine the response of a cantilever to lateral forces in terms of its normal force response. This procedure is quite general. It will work with any type of deflection sensor and does not require the knowledge or direct measurement of the lever dimensions or the tip height. In addition, the shape of the tip apex can be determined. We also discuss a number of specific issues related to force and friction measurements using optical lever deflection sensing. We present experimental results on the lateral force response of commercially available V-shaped cantilevers. Our results are consistent with estimates of lever mechanical properties using continuum elasticity theory. {copyright} {ital 1996 American Institute of Physics.}},
doi = {10.1063/1.1147411},
journal = {Review of Scientific Instruments},
number = 9,
volume = 67,
place = {United States},
year = {1996},
month = {9}
}