Defect-related versus excitonic visible light emission from ion beam synthesized Si nanocrystals in SiO{sub 2}
- Thomas J. Watson Laboratory of Applied Physics, California Institute of Technology, Pasadena, California 91125 (United States)
- FOM Institute for Atomic and Molecular Physics, Kruislaan 407, 1098 SJ Amsterdam (the Netherlands)
Two sources of room temperature visible luminescence are identified from SiO{sub 2} films containing ion beam synthesized Si nanocrystals. From a comparison of luminescence spectra and photoluminescence decay lifetime measurements between Xe{sup +}-implanted SiO{sub 2} films and SiO{sub 2} films containing Si nanocrystals, a luminescence feature attributable to defects in the SiO{sub 2} matrix is unambiguously identified. Hydrogen passivation of the films selectively quenches the matrix defect luminescence, after which luminescence attributable to Si nanocrystals is evident, with a lifetime on the order of milliseconds. The peak energy of the remaining luminescence attributable to Si nanocrystals {open_quote}{open_quote}redshifts{close_quote}{close_quote} as a function of different processing parameters that might lead to increased nanocrystal size and the intensity is directly correlated to the formation of Si nanocrystals. Upon further annealing hydrogen-passivated samples at low temperatures ({lt}500{degree}C), the intensity of nanocrystal luminescence increases by more than a factor of 10. {copyright} {ital 1996 American Institute of Physics.}
- DOE Contract Number:
- FG03-89ER45395
- OSTI ID:
- 383730
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 14 Vol. 69; ISSN APPLAB; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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