Electronic structure of Tl{sub 2}Ba{sub 2}CuO{sub 6+{delta}} epitaxial films measured by x-ray photoemission

Journal Article · Sun Sep 01 04:00:00 EDT 1996 · Physical Review, B: Condensed Matter

DOI:https://doi.org/10.1103/PhysRevB.54.6115· OSTI ID:383234

Vasquez, R P ^[1]; Ren, Z F; Wang, J H ^[2]

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1. Center for Space Microelectronics Technology, Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91109-8099 (United States)
2. Superconductive Materials Laboratory, Department of Chemistry and New York State Institute on Superconductivity, State University of New York at Buffalo, Buffalo, New York 14260-3000 (United States)

The valence electronic structure and core levels of Tl{sub 2}Ba{sub 2}CuO{sub 6+{delta}} (Tl-2201) epitaxial films have been measured with x-ray photoelectron spectroscopy and are compared to those of Tl{sub 2}Ba{sub 2}CaCu{sub 2}O{sub 8+{delta}} (Tl-2212). Changes in the Tl-2201 core-level binding energies with oxygen doping are consistent with a change in the chemical potential. Differences between the Tl-2201 and Tl-2212 measured densities of states are consistent with the calculated Cu 3{ital d} and Tl 6{ital s} partial densities of states. {copyright} {ital 1996 The American Physical Society.}

• OSTI ID: 383234
• Journal Information: Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 9 Vol. 54; ISSN PRBMDO; ISSN 0163-1829
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BARIUM OXIDES
BINDING ENERGY
COMPARATIVE EVALUATIONS
COPPER OXIDES
ELECTRON CORRELATION
ELECTRONIC STRUCTURE
ENERGY-LEVEL DENSITY
EPITAXIAL LAYERS
HIGH-TC SUPERCONDUCTORS
PHOTOELECTRON SPECTROSCOPY
SPUTTERED MATERIALS
THALLIUM OXIDES