Microwave surface resistance of YBa{sub 2}Cu{sub 3}Cu{sub 3}O{sub 7{minus}{ital x}} films on polycrystalline ceramic substrates with textured buffer layers
- Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
We have used a parallel-plate resonator technique to measure the microwave surface resist- ance {ital R}{sub {ital s}} of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{ital x}} (YBCO) films on buffered ceramic substrates at around 10 GHz, and studied the correlation between their {ital R}{sub {ital s}} and materials properties. A 0.4-{mu}m-thick YBCO film (with an in-plane mosaic spread of 7{degree}) grown on a polycrystalline alumina substrate with an ion-beam-assisted-deposited yttria-stabilized zirconia buffer layer showed an {ital R}{sub {ital s}} of 1.89 m{Omega} at 76 K and 0.21 m{Omega} at 4 K. We have observed a strong correlation between the {ital R}{sub {ital s}} of the samples and the in-plane mosaic spread of the YBCO films. This correlation can be explained qualitatively in terms of a simple model in which the weak links between the grains of the YBCO film form an electrical network of Josephson junctions.
- OSTI ID:
- 383087
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 11 Vol. 69; ISSN 0003-6951; ISSN APPLAB
- Country of Publication:
- United States
- Language:
- English
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