Quantitative analysis of thermal spray deposits using stereology
- State Univ. of New York, Stony Brook, NY (United States)
- LERMPS, Belfort (France)
Stereology deals with protocols for describing a 3-D space, when only 2-D sections through solid bodies are available. This paper describes a stereological characterization of the microstructure of a thermal spray deposit. The aim of this work is to present results on the stereological characterization of a thermal spray deposit, using two approaches known as DeHoff`s and Cruz-Orive`s protocols. The individual splats are assumed to have an oblate spheroidal shape. The splat size distribution and elongation ratio distribution of splats are calculated using quantitative information from 2-D plane sections. The stereological methods are implemented to investigate the microstructure of a water stabilized plasma spray-formed Al{sub 2}O{sub 3}-13wt.%TiO{sub 2}. Results are obtained with both protocols. The splat sizes range from 0 to 60 {micro}m and shape factors from 0.4 to 1.0. The splats within the deposit seem to be much smaller and thicker (i.e., lower spreading) than those of the first layer deposited onto the substrate. The approach described in this work provides helpful quantitative information on the 3-D microstructure of thermal spray deposit.
- OSTI ID:
- 377770
- Report Number(s):
- CONF-9509182-; ISBN 0-87170-541-9; TRN: IM9643%%43
- Resource Relation:
- Conference: 1995 National thermal spray conference, Houston, TX (United States), 11-15 Sep 1995; Other Information: PBD: 1995; Related Information: Is Part Of Advances in thermal spray science and technology. Proceedings of the 8. national thermal spray conference; Berndt, C.C.; Sampath, S. [eds.]; PB: 795 p.
- Country of Publication:
- United States
- Language:
- English
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