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Title: Depth of origin of secondary ions: Suppression and enhancement of ions upon passage through overlayers

Book ·
OSTI ID:375914
; ;  [1]
  1. Rutgers-the State Univ. of New Jersey, Piscataway, NJ (United States)

The authors are investigating the transmission of low energy ions (<10 eV) through ultrathin films of condensed rare gases. The goal is to address the issue of the depth of origin of secondary ions that desorb from solid surfaces under the impact of ionizing radiation, such as electrons, photons, or through ion sputtering. The secondary ions are produced by electron stimulated desorption (ESD) from a suitable substrate, such as an oxide or an adsorbate on a metal single crystal; the overlayer gas is condensed onto this substrate. The yield, energy and angular distributions of the ions are measured as a function of overlayer thickness. They find that 7 eV oxygen ions can be transmitted through rate gas films (Kr, Xe) several ML thick. In contrast, O{sup +} is completely suppressed by 0.5 ML of H{sub 2}O. Surprisingly, they find the F{sup {minus}} yield to be 4 times higher in the presence of 1 ML of Xe, compared to the clean surface value, accompanied by a dramatic change in the ions` angular distribution. They discuss a model which considers elastic scattering and charge transfer of the ions with rare gas atoms, as well as the structure of the surface and the electronic properties of the solid-vacuum interface.

OSTI ID:
375914
Report Number(s):
CONF-941144-; ISBN 1-55899-255-3; TRN: IM9642%%2
Resource Relation:
Conference: Fall meeting of the Materials Research Society (MRS), Boston, MA (United States), 28 Nov - 9 Dec 1994; Other Information: PBD: 1995; Related Information: Is Part Of Beam-solid interactions for materials synthesis and characterization; Jacobson, D.C. [ed.] [AT and T Bell Labs., Murray Hill, NJ (United States)]; Luzzi, D.E. [ed.] [Univ. of Pennsylvania, Philadelphia, PA (United States)]; Heinz, T.F. [ed.] [Columbia Univ., New York, NY (United States)]; Iwaki, Masaya [ed.] [Inst. of Physical and Chemical Research, Wako, Saitama (Japan)]; PB: 763 p.; Materials Research Society symposium proceedings, Volume 354
Country of Publication:
United States
Language:
English