Ideal semiconductors structures for studying photoinduced charge transfer processes
Conference
·
OSTI ID:370784
- Soreq NRC, Yavne (Israel)
- NREL, Golden, CO (United States)
We report on a novel semiconductor photoelectrode structure that exhibits nearly ideal dependence of the photocurrent-voltage characteristics on the concentration of a nonadsorbed, outer-sphere redox acceptor. The structure consists of a thin (30-50 {Angstrom}) epilayer of GaInP{sub 2} grown on a thick (5000 {Angstrom}) p-GaAs epilayer. The thin GaInP{sub 2} layer produces nearly perfect passivation of the GaAs surface, while at the same time permitting efficient electron transfer via field-assisted tunneling and/or thermionic emission. The structure ideal behavior is demonstrated also by the dependence of the photocurrent quantum yield on the GaInP{sub 2} barrier thickness, linear Mott-Schottky plots without hystersis to within 0.1 Volt of the flatband potential, and an acceptor concentration dependence of time-resolved photoluminescence measurements.
- OSTI ID:
- 370784
- Report Number(s):
- CONF-960376--
- Country of Publication:
- United States
- Language:
- English
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