High resolution x-ray diffractometry and topography of float-zone GaAs crystals grown in microgravity
- Bede Scientific Instruments, Durham (United Kingdom)
- Isfahan Univ. of Technology (Iran, Islamic Republic of)
- Daresbury Laboratory, Warrington (United Kingdom); and others
High resolution Bragg-case X-ray double and triple axis diffractometry and Laue-case white beam synchrotron X-ray topography experiments have been performed on undoped [001] oriented float-zone GaAs crystals have been grown under microgravity conditions in space on the D2 mission. Near the seed, excellent anomalous transmission was achieved and a clear cellular structure of dislocations observed. The double and triple axis rocking curves were comparable with those from semi-insulating terrestrial material. Following a heater failure, the molten zone height dropped and reciprocal space maps revealed a long ridge of scatter transverse to the diffraction vector direction. This corresponds to the presence of a distribution of sub-grains containing little internal strain. Continued growth resulted in twin formation. 6 refs., 5 figs., 1 tab.
- Sponsoring Organization:
- USDOE
- OSTI ID:
- 369814
- Report Number(s):
- CONF-9408178-; ISSN 0376-0308; TRN: 96:004756-0017
- Journal Information:
- Advances in X-Ray Analysis, Vol. 38; Conference: 43. annual Denver x-ray conference on applications of x-ray analysis, Steamboat Spring, CO (United States), 1-5 Aug 1994; Other Information: PBD: 1995
- Country of Publication:
- United States
- Language:
- English
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