Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Investigation of the X-ray diffraction properties of a synthetic multilayer. 1998 summer research program for high school juniors at the University of Rochester`s Laboratory for Laser Energetics: Student research reports

Technical Report ·
DOI:https://doi.org/10.2172/362528· OSTI ID:362528
 [1]
  1. Brighton High School, NY (United States)
In this investigation spectroscopy was used to evaluate the x-ray diffraction properties of a synthetic WB{sub 4}C multilayer for possible use in the OMEGA gated monochromatic x-ray imager (GMXI). The multilayer was placed on a diffractometer, and measurements were made with a lithium-drifted silicon [Si(Li)] x-ray detector, connected to a multi-channel analyzer. The properties of the multilayer were inferred from gaussian fits to the measured diffraction curves. A multilayer with a 2d spacing of 25 {angstrom} was tested at energies from 1.7 to 4.5 keV.
Research Organization:
Univ. of Rochester, Lab. for Laser Energetics, NY (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
FC03-92SF19460
OSTI ID:
362528
Report Number(s):
DOE/SF/19460--299-Pt.7; ON: DE99003387
Country of Publication:
United States
Language:
English