Phonon damping in thin films of Fe

Journal Article · Thu Jul 01 00:00:00 EDT 1999 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.370770· OSTI ID:349341

Roehlsberger, R; Sturhahn, W; Toellner, T S; Quast, K W; Hession, P; Hu, M; Sutter, J; Alp, E E ^[1]

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1. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

The phonon density of states (DOS) in thin films of polycrystalline {alpha}-Fe was measured by inelastic nuclear resonant scattering of synchrotron radiation. The thin-film DOS exhibits significant deviations from the DOS of bulk Fe, which we attribute to phonon lifetime broadening in the confined geometry. The measured DOS can be described with a damped harmonic oscillator model for the phonons with different quality factors Q=25(2) and Q=13(1) for layer thicknesses of 28 and 13 nm, respectively. {copyright} {ital 1999 American Institute of Physics.}

• OSTI ID: 349341
• Journal Information: Journal of Applied Physics, Vol. 86, Issue 1; Other Information: PBD: Jul 1999
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
HARMONIC OSCILLATORS
THIN FILMS
IRON
PHONONS
SYNCHROTRON RADIATION
STANDING WAVES
ENERGY-LEVEL DENSITY
RESONANCE SCATTERING
POLYCRYSTALS
INELASTIC SCATTERING