Phonon damping in thin films of Fe
- Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
The phonon density of states (DOS) in thin films of polycrystalline {alpha}-Fe was measured by inelastic nuclear resonant scattering of synchrotron radiation. The thin-film DOS exhibits significant deviations from the DOS of bulk Fe, which we attribute to phonon lifetime broadening in the confined geometry. The measured DOS can be described with a damped harmonic oscillator model for the phonons with different quality factors Q=25(2) and Q=13(1) for layer thicknesses of 28 and 13 nm, respectively. {copyright} {ital 1999 American Institute of Physics.}
- OSTI ID:
- 349341
- Journal Information:
- Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 1 Vol. 86; ISSN JAPIAU; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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