Wire breakage in SLC wire profile monitors

Journal Article · Tue Dec 01 04:00:00 EST 1998 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.57029· OSTI ID:348222

Field, C; McCormick, D; Raimondi, P; Ross, M ^[1]

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1. Stanford Linear Accelerator Center P.O. Box 4349, Stanford, California 94309 (United States)

Wire-scanning beam profile monitors are used at the Stanford Linear Collider (SLC) for emittance preservation control and beam optics optimization. Twenty such scanners have proven most useful for this purpose and have performed a total of 1.5 million scans in the 4 to 6 years since their installation. Most of the essential scanners are equipped with 20 to 40 {mu}m tungsten wires. SLC bunch intensities and sizes often exceed 2{times}10{sup 7}particles/{mu}m{sup 2} (3C/m{sup 2}). We believe that this has caused a number of tungsten wire failures that appear at the ends of the wire, near the wire support points, after a few hundred scans are accumulated. Carbon fibers, also widely used at SLAC (1), have been substituted in several scanners and have performed well. In this paper, we present theories for the wire failure mechanism and techniques learned in reducing the failures. {copyright} {ital 1998 American Institute of Physics.}

• Research Organization: Stanford Linear Accelerator Center
• DOE Contract Number: AC03-76SF00515
• OSTI ID: 348222
• Report Number(s): CONF-980573--
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 451; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
BEAM BUNCHING
BEAM EMITTANCE
BEAM MONITORING
BEAM PROFILES
SPATIAL RESOLUTION
STANFORD LINEAR COLLIDER