First multi-GeV particle-beam measurements using a synchroscan and dual-sweep x-ray streak camera

Journal Article · Tue Dec 01 04:00:00 EST 1998 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.57001· OSTI ID:348218

Lumpkin, A H; Yang, B ^[1]

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1. Advanced Photon Source Argonne National Laboratory Argonne, Illinois 60439 (United States)

Particle-beam characterizations of a multi-GeV storage ring beam have been done for the first time using a synchroscan and dual-sweep x-ray streak camera at the Advanced Photon Source (APS). The hard x-rays (2{endash}20 keV) from a bending magnet source were imaged using an adjustable pinhole aperture. Both the horizontal size, {sigma}{sub x}{approximately}190{mu}m, and bunch length, {sigma}{sub r}{approximately}28ps, were measured simultaneously. The Au photocathode provides sensitivity from 10 eV to 10 keV covering the three orders of magnitude in wavelength from the UV to hard x-rays. {copyright} {ital 1998 American Institute of Physics.}

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL
• Sponsoring Organization: USDOE
• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 348218
• Report Number(s): CONF-980573--
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 451; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
ADVANCED PHOTON SOURCE
BEAM BUNCHING
GEV RANGE 01-10
POSITRON BEAMS
SPATIAL RESOLUTION
STORAGE RINGS
STREAK PHOTOGRAPHY
X-RAY SPECTRA