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Modeling of ultra-short-pulse reflectometry

Journal Article · · Physics of Plasmas
DOI:https://doi.org/10.1063/1.873487· OSTI ID:344901
; ; ;  [1];  [2]
  1. Lawrence Livermore National Laboratory, University of California, Livermore, California 94551 (United States)
  2. Department of Applied Science, University of California at Davis, Davis, California 95616 (United States)

Pulsed reflectometry using both ordinary (O) and extraordinary (X) modes can provide time- and space-resolved measurements of the electron density, the magnitude of the magnetic field, the magnetic shear as a function of radius, and information on density and magnetic fluctuations. Such a diagnostic also yields the current profile from the curl of the magnetic field. This research addresses theoretical issues associated with the use of pulsed reflectometry with particular emphasis on applications in the Sustained Spheromak Physics Experiment (SSPX) at the Lawrence Livermore National Laboratory [E. B. Hooper {ital et al.}, {open_quotes}Sustained Spheromak Physics Experiment,{close_quotes} in Proceedings of the 17th International Atomic Energy Agency (IAEA) Fusion Energy Conference, Yokohama, Japan, October 19{endash}24, 1998, Lawrence Livermore National Laboratory Report UCRL-JC-132034 (September 29, 1998)]. Simulation results are presented for O- and X-mode mixed-polarization reflectometry and linear mode conversion in two spatial dimensions. The profile reconstruction algorithms depend on Wentzel{endash}Kramers{endash}Brillouin{endash}Jeffreys (WKBJ) formulae for group delays and linear mode conversion, which agree reasonably well with direct numerical solutions of the wave equation. Reconstructions of the electron density and modulus of the magnetic field are relatively robust in the presence of two-dimensional electron density and magnetic perturbations of the plasma.

OSTI ID:
344901
Report Number(s):
CONF-981127--
Journal Information:
Physics of Plasmas, Journal Name: Physics of Plasmas Journal Issue: 5 Vol. 6; ISSN PHPAEN; ISSN 1070-664X
Country of Publication:
United States
Language:
English

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