Characterization and photoemission dichroism of epitaxially grown Gd(0001)/Y(0001)
- Department of Physics, Virginia Commonwealth University, Richmond, Virginia 23284 (United States)
- Department of Physics, University of Missouri--Rolla, Rolla, Missouri 65401 (United States)
- Lawrence Livermore National Laboratory, Livermore, California 93550 (United States)
Gadolinium thin films approximately 100 {Angstrom} thick have been grown epitaxially on a Y(0001) substrate. A threefold characterization has been performed. The surface structural analyses of the yttrium substrate and the gadolinium films were performed using x-ray photoelectron diffraction (XPD) and low-energy electron diffraction (LEED). The results of the XPD and LEED studies strongly suggest that gadolinium films have an effective C{sub 6v} surface symmetry, consistent with earlier studies of other hcp (0001) surfaces. The elemental analysis of the substrate and the film was done with x-ray photoemission using Mg, Al K{alpha} x rays and synchrotron radiation. The magnetic analysis is based upon magnetic x-ray dichroisms observed in angle-resolved photoelectron spectroscopy, using both linearly polarized and circularly polarized synchrotron x-ray radiation as the excitation. Photoemission from the Gd 4f and 5p core-level states were used in this magnetic characterization and will be presented. This includes novel magnetic linear dichroism angular distribution results for the Gd 5p, which exhibit up to 40{percent} asymmetry, on a par with the previously reported circular dichroism results. {copyright} {ital 1998 American Vacuum Society.}
- OSTI ID:
- 342634
- Report Number(s):
- CONF-971029-; ISSN 0734-2101; TRN: 99:004753
- Journal Information:
- Journal of Vacuum Science and Technology, A, Vol. 16, Issue 3; Conference: 44. national symposium of the American Vacuum Society, San Jose, CA (United States), 20-24 Oct 1997; Other Information: PBD: May 1998
- Country of Publication:
- United States
- Language:
- English
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